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 [BibTeX] [RIS]
High-resolution pursuit for detecting flaw echoes close to the material surface in ultrasonic NDT
Type of publication: Article
Citation:
Journal: NDT and E International
Volume: 39
Number: 6
Year: 2006
Pages: 487--492
URL: http://dx.doi.org/10.1016/j.nd...
DOI: 10.1016/j.ndteint.2006.02.002
Keywords:
Authors Ruiz-Reyes, Nicolás
Vera-Candeas, Pedro
Curpián-Alonso, J.
Cuevas-Martínez, J. C.
Blanco, José-Luis
Added by: []
Total mark: 0
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