TY  - JOUR
T1  - High-resolution pursuit for detecting flaw echoes close to the material surface in ultrasonic NDT
A1  - Ruiz-Reyes, Nicolás
A1  - Vera-Candeas, Pedro
A1  - Curpián-Alonso, J.
A1  - Cuevas-Martínez, J. C.
A1  - Blanco, José-Luis
JA  - NDT and E International
Y1  - 2006
VL  - 39
IS  - 6
SP  - 487
EP  - 492
UR  - http://dx.doi.org/10.1016/j.ndteint.2006.02.002
M2  - doi: 10.1016/j.ndteint.2006.02.002
ER  -